Manual Analytical Submicron Prober is designed to make electrical contact between measuring circuits and IC patterns, micron/submicron metallized buses, for visual inspection of structures as well as for isolation of some patterns during diagnostics of internal IC block condition under normal and higher temperatures
The semiautomatic EM-6520 probers are intended for finishing and interoperational control of LSI and VLSI on a wafer having a diameter of up to 200 mm
EM-6190A automatic prober is designed to ensure electrical contact between probes and contact pads of ICs on the wafer
EM-6290 new generation Automatic Prober is intended to provide for contacting between probes and IC contact pads
Probe Cards used in probing equipment are designed to ensure electrical contact between probes and contact pads of ICs and semiconductor devices on wafers.