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Equipment for mask pattern generation and inspection

Multichannel laser generators

Pattern generators

Automatic mask inspection

Photomask inspection

Laser-based mask defect repair systems

Photorepeaters

Equipment for wafer pattern generation and inspection

Steppers

Large-area steppers

Pattern generator for wafers

Mask Aligners

Inspection of wafers and substrates

Chip Preparation Equipment

Probers

Wafer Grinders

Dicing Saws

Die Control and Cassetting Systems

Assembly and Packaging Equipment, Laser Processing

Die Bonders

Wire Bonders

Wafer Bonders

IC Pretreatment Equipment

Laser Processing Equipment

Microscopy, Optical Components

Microscopes
MICRO 200-01, MICRO 200T-01
MI-1
MI-2
MK-1, MK-1T
MK-3, MK-3T
MK-AM

Optical Components

Medical Equipment

Cardiology

Reanimation and intensive care

Surgery and trauma

Physiotherapy, neurology

Molds, Linear Step Motors, Sensors

Molds

Linear Step Motors

Step Motors, Sensors

Microscopes


MICRO 200-01, MICRO 200Т-01

Microscopes are designed for visual inspection of semiconductor wafers and photomasks as well as for researches in other fields of science and technology

MI-1

The inverted microscopes MI-1 and MI-1T are intended for inspection and research in metallography and other fields of science and technology

MI-2

MI-2 and MI-2T inverted microscopes are intended for a wide scope of tasks in various fields of science, technology, and education.

Microinspection station MK-1, MK-1T

The microinspection station is an inspection and measuring system based on the MICRO 200-01 (MICRO 200T-01)microscope

Microinspection station MK-3, MK-3T

The microinspection station is an inspection and measurement system based on the MI-1 microscope

Visual inspection and automated wafers dice marking station MK-AM

The MK-AM system is intended for visual die inspection of IC, using a microscope, with the aim of finding bad dice on the wafers and marking them automatically


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